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METALLURGICAL TESTING BLOG
  • Test plan development to meet particular specifications and standards.
  • Test plan development for failure analysis.

Contact Robert Mensah: robert.mensah@metallurgicaltesting.org

Scanning Electron Microscopy

Used mostly in failure analysis, scanning electron microscopy is used for secondary electron imaging, backscatter electron imaging of specimens and components. Visit www.metallurgicalconsult.com with inquiries about scanning electron microscopy.

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